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"Static noise margin variation for sub-threshold SRAM in 65-nm CMOS."

Benton H. Calhoun, Anantha P. Chandrakasan (2006)

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DOI: 10.1109/JSSC.2006.873215

access: closed

type: Journal Article

metadata version: 2021-10-15

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  - https://dblp.org/rec/journals/jssc/CalhounC06a
Benton H. Calhoun, Anantha P. Chandrakasan:
Static noise margin variation for sub-threshold SRAM in 65-nm CMOS. IEEE J. Solid State Circuits 41(7): 1673-1679 (2006)

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