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"Impact of extrinsic and intrinsic parameter fluctuations on CMOS circuit ..."

Keith A. Bowman et al. (2000)

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DOI: 10.1109/4.859508

access: closed

type: Journal Article

metadata version: 2022-06-23

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Keith A. Bowman, Xinghai Tang, John C. Eble, James D. Menldl:
Impact of extrinsic and intrinsic parameter fluctuations on CMOS circuit performance. IEEE J. Solid State Circuits 35(8): 1186-1193 (2000)

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