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"Thermal coupling in integrated circuits: application to thermal testing."

Josep Altet et al. (2001)

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DOI: 10.1109/4.896232

access: closed

type: Journal Article

metadata version: 2023-07-06

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  - https://dblp.org/rec/journals/jssc/AltetRSDC01
Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys:
Thermal coupling in integrated circuits: application to thermal testing. IEEE J. Solid State Circuits 36(1): 81-91 (2001)

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