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"Special Issue on Dynamic Analysis and Testing of Embedded Software."

W. Eric Wong et al. (2012)

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DOI: 10.1016/J.JSS.2011.09.044

access: closed

type: Journal Article

metadata version: 2020-02-24

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W. Eric Wong, W. K. Chan, T. H. Tse, Fei-Ching Kuo:
Special Issue on Dynamic Analysis and Testing of Embedded Software. J. Syst. Softw. 85(1): 1-2 (2012)

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