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"Fine-grained just-in-time defect prediction."
Luca Pascarella, Fabio Palomba, Alberto Bacchelli (2019)
- Luca Pascarella, Fabio Palomba, Alberto Bacchelli:
Fine-grained just-in-time defect prediction. J. Syst. Softw. 150: 22-36 (2019)
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