"Fundamental differences in the reliability of N-modular redundancy and ..."

Dave E. Eckhardt, Larry D. Lee (1988)

Details and statistics

DOI: 10.1016/0164-1212(88)90014-3

access: closed

type: Journal Article

metadata version: 2020-02-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics