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"高层次时序电路可靠&#..."

Chengtian Ouyang, Lili Chen, Xi Wang (2017)

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DOI: 10.11896/J.ISSN.1002-137X.2017.11A.006

access: open

type: Journal Article

metadata version: 2020-03-24

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  - https://dblp.org/rec/journals/jsjkx/OuyangCW17
Chengtian Ouyang, Lili Chen, Xi Wang:
高层次时序电路可靠度估计方法研究进展 (Survey on Reliability Estimation Methods of Sequential Circuit in Height-level). 计算机科学 44(Z11): 33-38 (2017)

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