"基于卷积去噪自编码&#..."

Yuetong Luo et al. (2020)

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DOI: 10.11896/JSJKX.190100141

access: open

type: Journal Article

metadata version: 2020-04-27

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  - https://dblp.org/rec/journals/jsjkx/LuoBZRY20
Yuetong Luo, Jingshuai Bian, Meng Zhang, Yongming Rao, Feng Yan:
基于卷积去噪自编码器的芯片表面弱缺陷检测方法 (Detection Method of Chip Surface Weak Defect Based on Convolution Denoising Auto-encoders). 计算机科学 47(2): 118-125 (2020)

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