"Persistence Length as a Metric for Modeling and Simulation of Nanoscale ..."

Stephen F. Bush, Sanjay Goel (2013)

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DOI: 10.1109/JSAC.2013.SUP2.12130014

access: closed

type: Journal Article

metadata version: 2020-04-02

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Stephen F. Bush, Sanjay Goel:
Persistence Length as a Metric for Modeling and Simulation of Nanoscale Communication Networks. IEEE J. Sel. Areas Commun. 31(12-Supplement): 815-824 (2013)

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