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"Fault behavior and testability of asynchronous CMOS circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Heinrich Theodor Vierhaus et al. (1993)

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DOI: 10.1016/0165-6074(93)90148-E

access: closed

type: Journal Article

metadata version: 2020-05-19

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  dblp key:
  - journals/jsa/VierhausMGC93
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  - https://dblp.org/rec/journals/jsa/VierhausMGC93
Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser, Raul Camposano:
Fault behavior and testability of asynchronous CMOS circuits. Microprocess. Microprogramming 38(1-5): 223-228 (1993)

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