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"CMOS fault modeling, test generation and design for testability."

C. Matthäus et al. (1988)

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DOI: 10.1016/0165-6074(88)90059-2

access: closed

type: Journal Article

metadata version: 2022-08-05

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  - journals/jsa/MatthausKGHV88
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  - https://dblp.org/rec/journals/jsa/MatthausKGHV88
C. Matthäus, B. Krüger-Sprengel, C. Glowacz, Uwe Hübner, Heinrich Theodor Vierhaus:
CMOS fault modeling, test generation and design for testability. Microprocess. Microprogramming 24(1-5): 233-238 (1988)

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