"Repair friendly wide-stripe erasure coding for in-memory key-value stores."

Xuzhe Liu et al. (2025)

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DOI: 10.1016/J.SYSARC.2025.103516

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type: Journal Article

metadata version: 2025-08-19

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Xuzhe Liu, Yuchong Hu, Dan Feng, Leihua Qin, Hai Zhou, Xin Zhao, Renzhi Xiao:
Repair friendly wide-stripe erasure coding for in-memory key-value stores. J. Syst. Archit. 167: 103516 (2025)

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