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"A new approach for critical area estimation in VLSI."

Xiaohong Jiang, Yue Hao, Susumu Horiguchi (2002)

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DOI: 10.1016/S1383-7621(01)00037-6

access: closed

type: Journal Article

metadata version: 2021-08-18

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  - journals/jsa/JiangHH02
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  - https://dblp.org/rec/journals/jsa/JiangHH02
Xiaohong Jiang, Yue Hao, Susumu Horiguchi:
A new approach for critical area estimation in VLSI. J. Syst. Archit. 47(10): 869-881 (2002)

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