"Mixed level test generation for high fault coverage."

Uwe Hübner et al. (1991)

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DOI: 10.1016/0165-6074(91)90438-Y

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type: Journal Article

metadata version: 2022-08-17

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Uwe Hübner, H. Hinsen, M. Hofebauer, Heinrich Theodor Vierhaus:
Mixed level test generation for high fault coverage. Microprocessing and Microprogramming 32(1-5): 791-796 (1991)

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