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"Multiple boundary scan-paths for minimizing circuit-board test-application ..."

Theodoros Antonakopoulos, Nick Kanopoulos (1994)

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DOI: 10.1016/0165-6074(94)90104-X

access: closed

type: Journal Article

metadata version: 2022-06-23

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Theodoros Antonakopoulos, Nick Kanopoulos:
Multiple boundary scan-paths for minimizing circuit-board test-application time. Microprocess. Microprogramming 40(6): 377-386 (1994)

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