"Ensuring Power-Safe Application of Test Patterns Using an Effective Gating ..."

Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty (2012)

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DOI: 10.1166/JOLPE.2012.1187

access: closed

type: Journal Article

metadata version: 2020-05-22

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Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty:
Ensuring Power-Safe Application of Test Patterns Using an Effective Gating Approach Considering Current Limits. J. Low Power Electron. 8(2): 235-247 (2012)

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