


default search action
"Magnetic Tunnel Junction Reliability Assessment Under Process Variations ..."
Anirudh Srikant Iyengar, Swaroop Ghosh, Nitin Rathi (2018)
- Anirudh Srikant Iyengar, Swaroop Ghosh, Nitin Rathi
:
Magnetic Tunnel Junction Reliability Assessment Under Process Variations and Activity Factors and Mitigation Techniques. J. Low Power Electron. 14(2): 217-226 (2018)

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.