"Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between ..."

Patrick Girard, Yannick Bonhomme (2005)

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DOI: 10.1166/JOLPE.2005.004

access: closed

type: Journal Article

metadata version: 2020-05-22

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Patrick Girard, Yannick Bonhomme:
Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between Test Power and Scan Routing. J. Low Power Electron. 1(1): 85-95 (2005)

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