"Leakage Analysis Considering the Effect of Inter-Cell Wire Resistance for ..."

Paulo F. Butzen et al. (2010)

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DOI: 10.1166/JOLPE.2010.1070

access: closed

type: Journal Article

metadata version: 2021-10-14

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Paulo F. Butzen, Vinícius Dal Bem, André Inácio Reis, Renato P. Ribas:
Leakage Analysis Considering the Effect of Inter-Cell Wire Resistance for Nanoscaled CMOS Circuits. J. Low Power Electron. 6(1): 192-200 (2010)

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