"Bayesian degradation modeling for reliability prediction of organic ..."

Suk Joo Bae, Tao Yuan, Seong-Joon Kim (2016)

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DOI: 10.1016/J.JOCS.2016.08.006

access: closed

type: Journal Article

metadata version: 2020-02-25

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Suk Joo Bae, Tao Yuan, Seong-Joon Kim:
Bayesian degradation modeling for reliability prediction of organic light-emitting diodes. J. Comput. Sci. 17: 117-125 (2016)

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