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"Timing-Aware Cell Layout Regularity Enhancement for Reduction of ..."

Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada (2011)

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DOI: 10.4156/JNIT.VOL2.ISSUE4.1

access: closed

type: Journal Article

metadata version: 2023-01-18

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Tetsuya Iizuka, Makoto Ikeda, Kunihiro Asada:
Timing-Aware Cell Layout Regularity Enhancement for Reduction of Systematic Gate Critical Dimension Variation. J. Next Gener. Inf. Technol. 2(4): 1-9 (2011)

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