"Delay Test with Embedded Test Pattern Generator."

Nan-Cheng Lai, Sying-Jyan Wang (2013)

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DOI: —

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type: Journal Article

metadata version: 2021-07-16

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Nan-Cheng Lai, Sying-Jyan Wang:
Delay Test with Embedded Test Pattern Generator. J. Inf. Sci. Eng. 29(3): 545-556 (2013)

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