"Testable Path Delay Fault Cover for Sequential Circuits."

Angela Krstic, Srimat T. Chakradhar, Kwang-Ting Cheng (2000)

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type: Journal Article

metadata version: 2021-07-16

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Angela Krstic, Srimat T. Chakradhar, Kwang-Ting Cheng:
Testable Path Delay Fault Cover for Sequential Circuits. J. Inf. Sci. Eng. 16(5): 673-686 (2000)

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