"A Novel Defect Inspection System Using Convolutional Neural Network for ..."

Mingxing Deng et al. (2022)

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DOI: 10.3390/JIMAGING8100268

access: open

type: Journal Article

metadata version: 2025-06-18

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Mingxing Deng, Quanyong Zhang, Kun Zhang, Hui Li, Yikai Zhang, Wan Cao:
A Novel Defect Inspection System Using Convolutional Neural Network for MEMS Pressure Sensors. J. Imaging 8(10): 268 (2022)

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