"Automated surface defect detection framework using machine vision and ..."

Swarit Anand Singh, K. A. Desai (2023)

> Home

Details and statistics

DOI: 10.1007/S10845-021-01878-W

access: closed

type: Journal Article

metadata version: 2023-05-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jim/SinghD23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jim/SinghD23
Swarit Anand Singh, K. A. Desai:
Automated surface defect detection framework using machine vision and convolutional neural networks. J. Intell. Manuf. 34(4): 1995-2011 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.