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"Discriminative feature learning and cluster-based defect label ..."

Seyoung Park, Jaeyeon Jang, Chang Ouk Kim (2021)

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DOI: 10.1007/S10845-020-01571-4

access: closed

type: Journal Article

metadata version: 2021-10-14

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Seyoung Park, Jaeyeon Jang, Chang Ouk Kim:
Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels. J. Intell. Manuf. 32(1): 251-263 (2021)

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