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"Applying the support vector machine with optimal parameter design into an ..."

Chung-Feng Jeffrey Kuo, Chun-Ping Tung, Wei-Han Weng (2019)

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DOI: 10.1007/S10845-016-1275-1

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/jim/KuoTW19
Chung-Feng Jeffrey Kuo, Chun-Ping Tung, Wei-Han Weng:
Applying the support vector machine with optimal parameter design into an automatic inspection system for classifying micro-defects on surfaces of light-emitting diode chips. J. Intell. Manuf. 30(2): 727-741 (2019)

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