Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Joint modeling of classification and regression for improving faulty wafer ..."

Seokho Kang (2020)

> Home

Details and statistics

DOI: 10.1007/S10845-018-1447-2

access: closed

type: Journal Article

metadata version: 2022-12-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jim/Kang20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jim/Kang20
Seokho Kang:
Joint modeling of classification and regression for improving faulty wafer detection in semiconductor manufacturing. J. Intell. Manuf. 31(2): 319-326 (2020)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.