"Multi-source wafer map retrieval based on contrastive learning for root ..."

Wei-Jyun Hong, Chia-Yu Shen, Pei-Yuan Wu (2025)

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DOI: 10.1007/S10845-023-02233-X

access: closed

type: Journal Article

metadata version: 2025-03-03

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Wei-Jyun Hong, Chia-Yu Shen, Pei-Yuan Wu:
Multi-source wafer map retrieval based on contrastive learning for root cause analysis in semiconductor manufacturing. J. Intell. Manuf. 36(1): 259-270 (2025)

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