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"A neural network approach to characterize pattern parameters in process ..."

Ruey-Shiang Guh, J. D. T. Tannock (1999)

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DOI: 10.1023/A%3A1008975131304

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/jim/GuhT99
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Ruey-Shiang Guh, J. D. T. Tannock:
A neural network approach to characterize pattern parameters in process control charts. J. Intell. Manuf. 10(5): 449-462 (1999)

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