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"Bayesian network for integrated circuit testing probe card fault diagnosis ..."
Wenhan Fu, Chen Fu Chien, Lizhen Tang (2022)
- Wenhan Fu
, Chen Fu Chien
, Lizhen Tang:
Bayesian network for integrated circuit testing probe card fault diagnosis and troubleshooting to empower Industry 3.5 smart production and an empirical study. J. Intell. Manuf. 33(3): 785-798 (2022)
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