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"Fault isolation by test scheduling for embedded systems using a ..."

Daoud Aït-Kadi, Zineb Simeu-Abazi, Ahmed Arous (2018)

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DOI: 10.1007/S10845-015-1088-7

access: closed

type: Journal Article

metadata version: 2021-10-14

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Daoud Aït-Kadi, Zineb Simeu-Abazi, Ahmed Arous:
Fault isolation by test scheduling for embedded systems using a probabilistic approach. J. Intell. Manuf. 29(3): 641-649 (2018)

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