"An Adjustable Description Quality Measure for Pattern Discovery Using the ..."

Kenneth A. Kaufman, Ryszard S. Michalski (2000)

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DOI: 10.1023/A:1008787919756

access: closed

type: Journal Article

metadata version: 2017-05-26

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Kenneth A. Kaufman, Ryszard S. Michalski:
An Adjustable Description Quality Measure for Pattern Discovery Using the AQ Methodology. J. Intell. Inf. Syst. 14(2-3): 199-216 (2000)

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