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"A critical analysis of the industrial device scanners' potentials, ..."

Mohammad Borhani et al. (2024)

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DOI: 10.1016/J.JII.2024.100623

access: closed

type: Journal Article

metadata version: 2024-08-04

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  - https://dblp.org/rec/journals/jiii/BorhaniGBAG24
Mohammad Borhani, Gurjot Singh Gaba, Juan Basaez, Ioannis Avgouleas, Andrei V. Gurtov:
A critical analysis of the industrial device scanners' potentials, risks, and preventives. J. Ind. Inf. Integr. 41: 100623 (2024)

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