"Reliability analysis of failure threshold value with uncertain Liu process."

Chun Wei et al. (2023)

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DOI: 10.3233/JIFS-224057

access: closed

type: Journal Article

metadata version: 2023-11-12

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Chun Wei, Haiyan Shi, Baoliang Liu, Zhiqiang Zhang, Yanqing Wen:
Reliability analysis of failure threshold value with uncertain Liu process. J. Intell. Fuzzy Syst. 44(6): 9757-9767 (2023)

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