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"Evaluation of line-type thin-film transistor liquid-crystal display ..."

No Kap Park, Suk In Yoo (2008)

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DOI: 10.1117/1.2957879

access: closed

type: Journal Article

metadata version: 2017-05-28

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No Kap Park, Suk In Yoo:
Evaluation of line-type thin-film transistor liquid-crystal display defects based on human visual perception. J. Electronic Imaging 17(3): 031107 (2008)

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