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"Deflectometric data segmentation for surface inspection: a fully ..."
Daniel Maestro-Watson et al. (2020)
- Daniel Maestro-Watson, Julen Balzategui, Luka Eciolaza, Nestor Arana-Arexolaleiba:
Deflectometric data segmentation for surface inspection: a fully convolutional neural network approach. J. Electronic Imaging 29(4): 041007 (2020)
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