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"Modal approach based on global stereocorrelation for defects measurement ..."
Khalil Hachem et al. (2024)
- Khalil Hachem, Yann Quinsat, Christophe Tournier, Nicolas Beraud:
Modal approach based on global stereocorrelation for defects measurement in wire-laser additive manufacturing. J. Electronic Imaging 33(3) (2024)
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