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"A Survey of Reliability Issues Related to Approximate Circuits."

Zhen Wang et al. (2023)

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DOI: 10.1007/S11390-023-2554-X

access: closed

type: Journal Article

metadata version: 2023-06-30

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Zhen Wang, Rong-Chen Xu, Jia-Cheng Chen, Jie Xiao:
A Survey of Reliability Issues Related to Approximate Circuits. J. Comput. Sci. Technol. 38(2): 273-288 (2023)

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