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ORCID"On Test Data Compression Using Selective Don't-Care Identification."
Terumine Hayashi et al. (2005)
- Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase:
On Test Data Compression Using Selective Don't-Care Identification. J. Comput. Sci. Technol. 20(2): 210-215 (2005)
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