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"Prediction of the Test Yield of Future Integrated Circuits Through the ..."

Chung-Huang Yeh, Jwu E. Chen (2023)

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DOI: 10.1142/S021812662350202X

access: closed

type: Journal Article

metadata version: 2023-09-14

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Chung-Huang Yeh, Jwu E. Chen:
Prediction of the Test Yield of Future Integrated Circuits Through the Deductive Estimation Method. J. Circuits Syst. Comput. 32(12): 2350202:1-2350202:20 (2023)

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