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"Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit ..."
Hui Xu et al. (2023)
- Hui Xu, Rui Zhu, Xia Sun, Xianjin Fang, Pan Qi, Huaguo Liang, Zhengfeng Huang:
Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit Degradation Prediction. J. Circuits Syst. Comput. 32(10): 2350175:1-2350175:19 (2023)
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