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"Discriminative Feature Selection Based on Imbalance SVDD for Fault ..."

Jian Wang, Jian Feng, Zhiyan Han (2016)

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DOI: 10.1142/S0218126616501437

access: closed

type: Journal Article

metadata version: 2024-03-08

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Jian Wang, Jian Feng, Zhiyan Han:
Discriminative Feature Selection Based on Imbalance SVDD for Fault Detection of Semiconductor Manufacturing Processes. J. Circuits Syst. Comput. 25(11): 1650143:1-1650143:21 (2016)

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