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"A Statistical Test Generation Based on Mutation Analysis for Improving the ..."

Yanjiang Liu et al. (2020)

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DOI: 10.1142/S0218126620500498

access: closed

type: Journal Article

metadata version: 2020-08-25

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  - https://dblp.org/rec/journals/jcsc/LiuZHX20
Yanjiang Liu, Yiqiang Zhao, Jiaji He, Ruishan Xin:
A Statistical Test Generation Based on Mutation Analysis for Improving the Hardware Trojan Detection. J. Circuits Syst. Comput. 29(3): 2050049:1-2050049:19 (2020)

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