"Itô-SDE MCMC method for Bayesian characterization of errors ..."

Maarten Arnst et al. (2017)

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DOI: 10.1016/J.JCP.2017.08.005

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type: Journal Article

metadata version: 2020-02-19

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Maarten Arnst, B. Abello Álvarez, J.-P. Ponthot, Romain Boman:
Itô-SDE MCMC method for Bayesian characterization of errors associated with data limitations in stochastic expansion methods for uncertainty quantification. J. Comput. Phys. 349: 59-79 (2017)

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