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ORCID"Analysis of Block Oxide Height Variations for a 40nm Gate Length bFDSOI-FET."
Jyi-Tsong Lin, Yi-Chuen Eng (2008)
- Jyi-Tsong Lin, Yi-Chuen Eng:
Analysis of Block Oxide Height Variations for a 40nm Gate Length bFDSOI-FET. J. Comput. 3(5): 41-45 (2008)
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