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"Retraction Note: Capacitance pin defect detection based on deep learning."

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DOI: 10.1007/S10878-024-01130-0

access: closed

type: Journal Article

metadata version: 2024-04-29

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Retraction Note: Capacitance pin defect detection based on deep learning. J. Comb. Optim. 47(3): 30 (2024)

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