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"Employing Keyed Hash Algorithm, Sequential Probability Ratio Test, and ..."

Jhon Aron F. Varca, Earl Nestor T. Velasquez, Joseph Bryan G. Ibarra (2021)

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DOI: 10.12720/JCM.16.11.500-507

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - journals/jcm/VarcaVI21
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  - https://dblp.org/rec/journals/jcm/VarcaVI21
Jhon Aron F. Varca, Earl Nestor T. Velasquez, Joseph Bryan G. Ibarra:
Employing Keyed Hash Algorithm, Sequential Probability Ratio Test, and Temperature Comparison Test as Security Against Node Capture Attacks of IoT-Based WSNs. J. Commun. 16(11): 500-507 (2021)

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