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"Extraction and Analysis of Spatial Correlation Micrograph Features for ..."

Adam Dachowicz, Mikhail J. Atallah, Jitesh H. Panchal (2020)

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DOI: 10.1115/1.4046891

access: closed

type: Journal Article

metadata version: 2021-01-05

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  - journals/jcise/DachowiczAP20
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  - https://dblp.org/rec/journals/jcise/DachowiczAP20
Adam Dachowicz, Mikhail J. Atallah, Jitesh H. Panchal:
Extraction and Analysis of Spatial Correlation Micrograph Features for Traceability in Manufacturing. J. Comput. Inf. Sci. Eng. 20(5) (2020)

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