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"On Embedding Test Patterns into Low-Power Bist Sequences."

Ioannis Voyiatzis (2008)

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DOI: 10.1080/08874417.2009.11646049

access: closed

type: Journal Article

metadata version: 2020-04-16

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  - journals/jcis/Voyiatzis08
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  - https://dblp.org/rec/journals/jcis/Voyiatzis08
Ioannis Voyiatzis:
On Embedding Test Patterns into Low-Power Bist Sequences. J. Comput. Inf. Syst. 49(2): 58-64 (2008)

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